完整後設資料紀錄
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dc.contributor.authorTseng, Hung-Rueien_US
dc.contributor.authorHsu, Shun-Chiehen_US
dc.contributor.authorLin, Shih-Lien_US
dc.contributor.authorChen, Yin-Hanen_US
dc.contributor.authorLin, Chien-Chungen_US
dc.date.accessioned2016-03-28T00:05:43Z-
dc.date.available2016-03-28T00:05:43Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-4799-4398-2en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/129789-
dc.description.abstractA nano-scale p-n junction diode is set up for photovoltaic response simulation, and the codes are based on Matlab. environment. The continuity and transport equations for electrons and holes are installed in the program and proper boundary conditions are used. The surface recombination velocity is found to be an influential parameter for the short-circuit current under regular AM1.5 solar excitation. From the simulation, a 35% degradation on Jsc can be expected in the nano-scale device when the surface recombination velocity increases from almost zero to 107 m/s. Meanwhile the reduction of the minority carrier lifetime is not as detrimental as the surface recombination towards the nano-scale photovoltaic device.en_US
dc.language.isoen_USen_US
dc.subjectNumerical Simulationen_US
dc.subjectNano-scale Devicesen_US
dc.subjectPhotovoltaic Devicesen_US
dc.subjectSolar Cellsen_US
dc.subjectSurface Recombinationen_US
dc.titleSurface Recombination Dependent Performance of A Nano-scale P-n Junction Solar Cellen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC)en_US
dc.citation.spage1106en_US
dc.citation.epage1109en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.identifier.wosnumberWOS:000366638901073en_US
dc.citation.woscount0en_US
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