| Title: | SIMULATION OF ELECTRIC FIELD DISTRIBUTION IN CMOS SINGLE PHOTON AVALANCHE DIODES AT BREAKDOWN VOLTAGE |
| Authors: | Wu, Jau-Yang Lin, Sheng-Di 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| Issue Date: | 1-Jan-2014 |
| Abstract: | We simulate the electric field distribution in single-photon avalanche diodes (SPADs) fabricated by CMOS 0.25-mu m high-voltage technology to explain the observed non-uniform 2-D photo-count mapping. The cause of non-uniform electric field distribution at the breakdown voltage is discussed with the aid of simulation. A method for improving the electric field uniformity is also proposed accordingly. |
| URI: | http://hdl.handle.net/11536/129802 |
| ISSN: | 2160-5033 |
| Journal: | 2014 INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS (OMN) |
| Begin Page: | 187 |
| End Page: | 188 |
| Appears in Collections: | Conferences Paper |
- 標準CMOS製程之低暗記數單光子崩潰二極體 / 許方則;Hsu, Fang-Ze;林聖廸;Lin, Sheng-Di
- 單光子崩潰二極體陣列之串音現象 / 吳岱融;林聖迪;Wu, Dai-Rong;Lin, Sheng-Di
- Crosstalk Between Single-Photon Avalanche Diodes in a 0.18-mu m High-Voltage CMOS Process / Wu, Dai-Rong;Tsai, Chia-Ming;Huang, Yi-Hsiang;Lin, Sheng-Di
- Photon-Detection-Probability Simulation Method for CMOS Single-Photon Avalanche Diodes / Hsieh, Chin-An;Tsai, Chia-Ming;Tsui, Bing-Yue;Hsiao, Bo-Jen;Lin, Sheng-Di
- Single-photon avalanche diodes in 0.18-mu m high-voltage CMOS technology / Huang, L. D.;Wu, J. Y.;Wang, J. P.;Tsai, C. M.;Huang, Y. H.
- Two-dimensional photo-mapping on CMOS single-photon avalanche diodes / Wu, Jau-Yang;Lu, Ping-Keng;Lin, Sheng-Di
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