完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHuang, Chia-Chien_US
dc.contributor.authorLin, Chang-Tzuen_US
dc.contributor.authorLiao, Wei-Syunen_US
dc.contributor.authorLee, Chieh-Juien_US
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorLee, Chia-Hsinen_US
dc.contributor.authorKwai, Ding-Mingen_US
dc.date.accessioned2016-03-28T00:05:45Z-
dc.date.available2016-03-28T00:05:45Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-4799-6492-5en_US
dc.identifier.issn1063-6404en_US
dc.identifier.urihttp://hdl.handle.net/11536/129834-
dc.description.abstractThere are many works on the power network design and prototyping for digital designs, however some usual and practical design concerns are not addressed. In this work, we present a realistic power network design methodology without IR violation certified by state-of-the-art commercial tool. Our work integrates analysis, optimization and synthesis of power network. In particular, we consider thermal effect and power pad\'s positions during the prototyping of power network. A scenario in placement regarding the violation of design rules is considered and resolved by maximum flow algorithm at the same stage. After the synthesis of initial power network, we generate a sensitivity matrix which is correlated with nodal voltage and resistances of net and via in metal layers. Furthermore, a Sequential Linear Programming(SLP) will be applied to adjust the sensitivity matrix iteratively until the IR drop constraint is satisfied. Our work is experimented on a real design in TSMC 65nm LP process, and the result validates our framework that the IR-Drop can be reduced to 2% of supply voltage.en_US
dc.language.isoen_USen_US
dc.titleImproving Power Delivery Network Design by Practical Methodologiesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 32ND IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD)en_US
dc.citation.spage230en_US
dc.citation.epage235en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000369867800034en_US
dc.citation.woscount0en_US
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