奈米微粒質量的測量技術研究與改進

Full metadata record

DC Field	Value	Language
dc.contributor.author	蔡春進	zh_TW
dc.contributor.author	TSAI CHUEN - JINN	en_US
dc.date.accessioned	2016-03-28T08:17:49Z	-
dc.date.available	2016-03-28T08:17:49Z	-
dc.date.issued	2015	en_US
dc.identifier.govdoc	MOST103-2221-E009-012-MY3	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/130462	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=11282484&docId=458241	en_US
dc.description.sponsorship	科技部	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	奈米微粒質量的測量技術研究與改進	zh_TW
dc.title	Investigation and Improvement of the Mass Measurement Technique for Nanoparticles	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學環境工程研究所	zh_TW
Appears in Collections:	Research Plans

APA	蔡., & TSAI C. - JINN (2015). 奈米微粒質量的測量技術研究與改進. https://www.grb.gov.tw/search/planDetail?id=11282484&docId=458241.
Bibtex	@article{2015, title={奈米微粒質量的測量技術研究與改進}, author={蔡春進 and TSAI CHUEN - JINN}, journal={https://www.grb.gov.tw/search/planDetail?id=11282484&docId=458241}, year={2015}, url={https://ir.lib.nycu.edu.tw/handle/11536/130462?mode=full}, }