完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lee, CC | en_US |
dc.contributor.author | Kao, TC | en_US |
dc.contributor.author | Chien, HC | en_US |
dc.contributor.author | Chi, S | en_US |
dc.date.accessioned | 2014-12-08T15:18:02Z | - |
dc.date.available | 2014-12-08T15:18:02Z | - |
dc.date.issued | 2005-12-01 | en_US |
dc.identifier.issn | 1041-1135 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/LPT.2005.859536 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/13048 | - |
dc.description.abstract | A novel supervising technique, based on different time-delay recognition scheme, for monitoring the switch fabric of optical cross-connects is proposed. This method features fast detection, high reliability, fault location, and actual routing information. The supervising of 4 x 4 switch fabric with a detecting time of less than 300 ns was achieved. It is also verified experimentally that the degradation of the system performance caused by this supervising approach is negligible. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | optical cross-connect (OXC) | en_US |
dc.subject | supervising | en_US |
dc.title | A novel supervisory scheme for OXC based on different time-dilay recognition | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/LPT.2005.859536 | en_US |
dc.identifier.journal | IEEE PHOTONICS TECHNOLOGY LETTERS | en_US |
dc.citation.volume | 17 | en_US |
dc.citation.issue | 12 | en_US |
dc.citation.spage | 2745 | en_US |
dc.citation.epage | 2747 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000233621000082 | - |
dc.citation.woscount | 5 | - |
顯示於類別: | 期刊論文 |