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dc.contributor.authorLee, CCen_US
dc.contributor.authorKao, TCen_US
dc.contributor.authorChien, HCen_US
dc.contributor.authorChi, Sen_US
dc.date.accessioned2014-12-08T15:18:02Z-
dc.date.available2014-12-08T15:18:02Z-
dc.date.issued2005-12-01en_US
dc.identifier.issn1041-1135en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LPT.2005.859536en_US
dc.identifier.urihttp://hdl.handle.net/11536/13048-
dc.description.abstractA novel supervising technique, based on different time-delay recognition scheme, for monitoring the switch fabric of optical cross-connects is proposed. This method features fast detection, high reliability, fault location, and actual routing information. The supervising of 4 x 4 switch fabric with a detecting time of less than 300 ns was achieved. It is also verified experimentally that the degradation of the system performance caused by this supervising approach is negligible.en_US
dc.language.isoen_USen_US
dc.subjectoptical cross-connect (OXC)en_US
dc.subjectsupervisingen_US
dc.titleA novel supervisory scheme for OXC based on different time-dilay recognitionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LPT.2005.859536en_US
dc.identifier.journalIEEE PHOTONICS TECHNOLOGY LETTERSen_US
dc.citation.volume17en_US
dc.citation.issue12en_US
dc.citation.spage2745en_US
dc.citation.epage2747en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000233621000082-
dc.citation.woscount5-
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