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dc.contributor.author郭治群zh_TW
dc.contributor.authorGuo Jyh-Chyurnen_US
dc.date.accessioned2016-03-29T00:01:07Z-
dc.date.available2016-03-29T00:01:07Z-
dc.date.issued2016en_US
dc.identifier.govdocMOST104-2221-E009-116-MY3zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/130798-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=11725991&docId=480655en_US
dc.description.sponsorship科技部zh_TW
dc.language.isozh_TWen_US
dc.title應用於平面與多閘極結構之奈米元件分析與模型研發以解析預測佈局與三維寄生效應對於高頻性能與寬頻雜訊之影響zh_TW
dc.titleA Comprehensive Characterization and Modeling of Layout Dependent Effects and 3-D Parasitics for RF Performance and Broadband Noise in Planar Bulk and Multi-Gate Nanoscale Deviceen_US
dc.typePlanen_US
dc.contributor.department國立交通大學電子工程學系及電子研究所zh_TW
顯示於類別:研究計畫