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dc.contributor.authorLan, YPen_US
dc.contributor.authorLin, YFen_US
dc.contributor.authorLi, YTen_US
dc.contributor.authorPan, RPen_US
dc.contributor.authorLee, CKen_US
dc.contributor.authorPan, CLen_US
dc.date.accessioned2014-12-08T15:18:13Z-
dc.date.available2014-12-08T15:18:13Z-
dc.date.issued2005-10-03en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OPEX.13.007905en_US
dc.identifier.urihttp://hdl.handle.net/11536/13173-
dc.description.abstractThe gap of a planar-aligned liquid crystal (LC) cell is measured by a novel method: Monitoring the change in output wavelength of an external-cavity diode laser by varying the voltage driving the LC cell placed in the laser cavity. This method is particularly suitable for measurement of LC cells of small phase retardation. Measurement errors of +/- 0.5 % and +/- 0.6 % for 9.6-mu m and 4.25-mu m cells with phase retardations of 1.63 mu m and 0.20 mu m respectively are demonstrated. (c) 2005 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleIntracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diodeen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OPEX.13.007905en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume13en_US
dc.citation.issue20en_US
dc.citation.spage7905en_US
dc.citation.epage7912en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000232544800022-
dc.citation.woscount2-
Appears in Collections:Articles


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