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dc.contributor.authorYeh, Chun-Chengen_US
dc.contributor.authorLiu, Hung-Chuanen_US
dc.contributor.authorChuang, Ming-Yenen_US
dc.contributor.authorDenzer, Josephen_US
dc.contributor.authorBerling, Dominiqueen_US
dc.contributor.authorZan, Hsiao-Wenen_US
dc.contributor.authorSoppera, Olivieren_US
dc.date.accessioned2017-04-21T06:56:41Z-
dc.date.available2017-04-21T06:56:41Z-
dc.date.issued2016-10-06en_US
dc.identifier.issn2196-7350en_US
dc.identifier.urihttp://dx.doi.org/10.1002/admi.201600373en_US
dc.identifier.urihttp://hdl.handle.net/11536/132644-
dc.description.abstractVarious kinds of zinc oxide (ZnO) nanostructures, such as ZnO nanowires, ZnO nanobelts, ZnO nanosheets, and ZnO nanorods are promising building blocks for nanoscale systems. However, to precisely control the size, shape, and to make a controlled assembly of synthesized ZnO nanostructures are major difficulties in the development of bottom-up devices. To overcome the challenge regarding reproducibility and positioning, a new method is proposed, deep ultra-violet (DUV) direct photo-patterning, to create ZnO micro- and nanostructures. A sol-gel formulation sensitive to DUV light and based on zinc methacrylate precursor is developed, and the photoreactions of zinc methacrylate under DUV light are carefully investigated by in situ spectroscopic ellipsometry, in situ FTIR, and XPS analysis. Then, the sol-gel solution is used as a negative tone resist in DUV lithography to evaluate its performance in producing high-resolution patterns. The results indicate that small patterns from micro-to nanoscale can be obtained in a simple and direct way.en_US
dc.language.isoen_USen_US
dc.titleControllable Formation of Zinc Oxide Micro- and Nanostructures via DUV Direct Patterningen_US
dc.identifier.doi10.1002/admi.201600373en_US
dc.identifier.journalADVANCED MATERIALS INTERFACESen_US
dc.citation.volume3en_US
dc.citation.issue19en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000386058100014en_US
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