完整後設資料紀錄
DC 欄位 | 值 | 語言 |
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dc.contributor.author | Mihaychuk, JG | en_US |
dc.contributor.author | Denhoff, MW | en_US |
dc.contributor.author | McAlister, SP | en_US |
dc.contributor.author | McKinnon, WR | en_US |
dc.contributor.author | Chin, A | en_US |
dc.date.accessioned | 2014-12-08T15:18:24Z | - |
dc.date.available | 2014-12-08T15:18:24Z | - |
dc.date.issued | 2005-09-01 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.2031946 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/13280 | - |
dc.description.abstract | In addition to Si band-edge electroluminescence (EL) near 1.1 eV, we observe hot-electron EL in metal-insulator-silicon tunnel diodes that can span a detector-limited range from 0.7 to 2.6 eV (1780-480 nm). The maximum photon energy increases with increasing forward bias. In one implementation, sub-micron-sized EL sites appear during the forward-bias stress. The number of sites grows linearly with the current, consistent with the dielectric breakdown of the insulator. We compare the poststress current-voltage data with the quantum-point-contact model. Results are presented for various p-type Si(100) devices having 2-8-nm-thick SiO2, Al2O3, and HfOxNy insulators. We also describe devices in which electron-beam lithography of an 18-nm-thick SiO2 is used to define EL sites. (c) 2005 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Broad-spectrum light emission at microscopic breakdown sites in metal-insulator-silicon tunnel diodes | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.2031946 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 98 | en_US |
dc.citation.issue | 5 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000231885600066 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |