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dc.contributor.authorWu, Kuan-Yien_US
dc.contributor.authorHsieh, Chou-Tingen_US
dc.contributor.authorWang, Liang-Hsunen_US
dc.contributor.authorHsu, Chih-Haoen_US
dc.contributor.authorChang, Shu-Tingen_US
dc.contributor.authorLan, Shih-Tingen_US
dc.contributor.authorHuang, Yi-Fanen_US
dc.contributor.authorChen, Yu-Mingen_US
dc.contributor.authorWang, Chien-Lungen_US
dc.date.accessioned2017-04-21T06:55:54Z-
dc.date.available2017-04-21T06:55:54Z-
dc.date.issued2016-11en_US
dc.identifier.issn1528-7483en_US
dc.identifier.urihttp://dx.doi.org/10.1021/acs.cgd.6b01391en_US
dc.identifier.urihttp://hdl.handle.net/11536/132862-
dc.description.abstractIn organic field-effect transistors (OFETs), the quality of charge transport pathway, controlled by crystal structures of organic semiconductors (OSCs), strongly affects the performance of the device. To achieve higher charge mobility, solution-processed single-crystal (SPSC) techniques have been used to decrease crystal defects by aligning the crystals of OSCs in the in-plane direction. Nonetheless, through SPSC techniques, whether the crystalline lattices are well aligned in the out-of-plane direction and how the out-of-plane lattice misorientaion affects OFET performances remain unclear. Here, a characterization protocol based on polarized optical microscope, X-ray diffraction, and electron diffraction is established to identify the lattice structure, the in-plane and out-of-plane lattice alignment in the crystal array of 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-PEN). Regardless of the solvents used in the PDMS-assisted crystallization, the characterization protocol confirms that all the crystal arrays share the same lattice structure (form I phase), and have similar in-plane lattice alignment. However, TIPS-PEN molecules have sufficient time to unify their out-of-plane orientation and prevent the formation of low angle grain boundary (LAGB) during crystal growth if high boiling temperature solvents are used. The improved out-of-plane lattice alignment increases the hole mobility and decreases the performance fluctuations of devices. The results confirm that the out-of-plane lattice alignment significantly impacts the performance of the devices and the reproducibility of the solution-processed TIPS-PEN OFETs.en_US
dc.language.isoen_USen_US
dc.titleInfluences of Out-Of-Plane Lattice Alignment on the OFET Performance of TIPS-PEN Crystal Arraysen_US
dc.identifier.doi10.1021/acs.cgd.6b01391en_US
dc.identifier.journalCRYSTAL GROWTH & DESIGNen_US
dc.citation.volume16en_US
dc.citation.issue11en_US
dc.citation.spage6160en_US
dc.citation.epage6166en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000387094600006en_US
Appears in Collections:Articles