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dc.contributor.authorBeysengulov, N. R.en_US
dc.contributor.authorRees, D. G.en_US
dc.contributor.authorTayurskii, D. A.en_US
dc.contributor.authorKono, K.en_US
dc.date.accessioned2017-04-21T06:55:37Z-
dc.date.available2017-04-21T06:55:37Z-
dc.date.issued2016-09en_US
dc.identifier.issn0021-3640en_US
dc.identifier.urihttp://dx.doi.org/10.1134/S002136401617001Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/132900-
dc.description.abstractWe study the transport of strongly interacting electrons on the surface of liquid helium confined in a microchannel geometry, near the current threshold point. The current threshold depends on the electrostatic confinement, created by the microchannel electrodes, and on the electrostatic potential of electron system. Depending on the geometry of the microchannel, the current pinch-off can occur at the center or move to the edges of the microchannel, as confirmed by Finite Element Model calculations. The confining potential dependence of electron conductivity above the current threshold point is consistent with a classical charge continuum model. However, we find that below the threshold point electron transport is suppressed due to charging energy effects.en_US
dc.language.isoen_USen_US
dc.titleTransport of Electrons on Liquid Helium in a Microchannel Device near the Current Thresholden_US
dc.identifier.doi10.1134/S002136401617001Xen_US
dc.identifier.journalJETP LETTERSen_US
dc.citation.volume104en_US
dc.citation.issue5en_US
dc.citation.spage323en_US
dc.citation.epage328en_US
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000388292500008en_US
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