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dc.contributor.authorZakharova, Aen_US
dc.contributor.authorNilsson, Ken_US
dc.contributor.authorChao, KAen_US
dc.contributor.authorYen, STen_US
dc.date.accessioned2019-04-03T06:42:52Z-
dc.date.available2019-04-03T06:42:52Z-
dc.date.issued2005-09-01en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.72.115329en_US
dc.identifier.urihttp://hdl.handle.net/11536/13291-
dc.description.abstractWe investigate spin-dependent interband magnetotunneling processes in strained broken-gap resonant tunneling structures made from InAs, AlSb, and GaSb, which are promising materials for quantum devices. InAs/AlSb/GaSb/InAs/AlSb/GaSb double-barrier structures grown on both InAs and GaSb are considered. Transmission coefficients for interband tunneling processes from individual eigenstates in the InAs emitter as well as current-voltage characteristics were calculated using a six-band k center dot p model and the scattering matrix method. We predict that due to lattice-mismatch induced strain, the interband tunneling current density for the structure grown on InAs can be one or two orders of magnitude less than that for the structure grown on GaSb. Furthermore, as a consequence of interband magnetotunneling, structures grown on different substrates yield different spin polarization of the tunneling current. It is obtained that the current spin polarization can be greater than 90%. These resonant tunneling structures can be used as spin filters in the rapidly growing field of spintronics.en_US
dc.language.isoen_USen_US
dc.titleSix-band k center dot p calculation of spin-dependent interband tunneling in strained broken-gap heterostructures under a quantizing magnetic fielden_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.72.115329en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume72en_US
dc.citation.issue11en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000232229100110en_US
dc.citation.woscount4en_US
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