完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLi, YCen_US
dc.contributor.authorTu, YHen_US
dc.contributor.authorKwei, CMen_US
dc.contributor.authorTung, CJen_US
dc.date.accessioned2014-12-08T15:18:28Z-
dc.date.available2014-12-08T15:18:28Z-
dc.date.issued2005-09-01en_US
dc.identifier.issn0039-6028en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.susc.2005.05.050en_US
dc.identifier.urihttp://hdl.handle.net/11536/13294-
dc.description.abstractTheoretical derivations of the inelastic differential inverse mean free path (DIMFP) and inelastic mean free path (IMFP) for electrons crossing solid surfaces were made for different crossing angles and electron distances relative to the crossing point at the surface. Individual contributions from volume and surface excitations were separated and analyzed for electrons traveling inside and outside the solid. Extended Drude dielectric functions were employed to calculate the DIMFP and inverse IMFP for electrons incident into and escaping from Cu. It was found that the DIMFP and inverse IMFP for electrons moving inside the solid were approximately independent of crossing angle and position of electrons due to the compensation of volume and surface excitations. For electrons moving deep inside the solid, the DIMFP and inverse IMFP reduced to the values for electrons moving in an infinite solid. As electrons traveling in the vacuum, the DIMFP and inverse IMFP became greater for glancing incident and escaping angles since surface excitations were more probable. The surface excitation parameter (SEP) for electrons traveling in vacuum showed an angular dependence. The SEP of escaping electrons was found larger than that of incident electrons due to the attractive force exerted by the induced surface charges. The calculated SEP was found to follow a simple expression. (c) 2005 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectelectronen_US
dc.subjectinelastic mean free pathen_US
dc.subjectsurface excitationen_US
dc.subjectvolume excitationen_US
dc.titleInfluence of the direction of motion on the inelastic interaction between electrons and solid surfacesen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.susc.2005.05.050en_US
dc.identifier.journalSURFACE SCIENCEen_US
dc.citation.volume589en_US
dc.citation.issue1-3en_US
dc.citation.spage67en_US
dc.citation.epage76en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000231301800007-
dc.citation.woscount34-
顯示於類別:期刊論文


文件中的檔案:

  1. 000231301800007.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。