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dc.contributor.authorHsieh, Sheng-Hsunen_US
dc.contributor.authorLi, Yung-Huien_US
dc.contributor.authorTien, Chung-Haoen_US
dc.date.accessioned2019-04-03T06:37:13Z-
dc.date.available2019-04-03T06:37:13Z-
dc.date.issued2016-12-01en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://dx.doi.org/10.3390/s16121994en_US
dc.identifier.urihttp://hdl.handle.net/11536/133090-
dc.description.abstractFor many practical applications of image sensors, how to extend the depth-of-field (DoF) is an important research topic; if successfully implemented, it could be beneficial in various applications, from photography to biometrics. In this work, we want to examine the feasibility and practicability of a well-known "extended DoF" (EDoF) technique, or "wavefront coding," by building real-time long-range iris recognition and performing large-scale iris recognition. The key to the success of long-range iris recognition includes long DoF and image quality invariance toward various object distance, which is strict and harsh enough to test the practicality and feasibility of EDoF-empowered image sensors. Besides image sensor modification, we also explored the possibility of varying enrollment/testing pairs. With 512 iris images from 32 Asian people as the database, 400-mm focal length and F/6.3 optics over 3 m working distance, our results prove that a sophisticated coding design scheme plus homogeneous enrollment/testing setups can effectively overcome the blurring caused by phase modulation and omit Wiener-based restoration. In our experiments, which are based on 3328 iris images in total, the EDoF factor can achieve a result 3.71 times better than the original system without a loss of recognition accuracy.en_US
dc.language.isoen_USen_US
dc.subjectwavefront codingen_US
dc.subjectextended depth of fielden_US
dc.subjectiris recognitionen_US
dc.subjectbiometricsen_US
dc.titleTest of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometricsen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s16121994en_US
dc.identifier.journalSENSORSen_US
dc.citation.volume16en_US
dc.citation.issue12en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000391303000014en_US
dc.citation.woscount1en_US
Appears in Collections:Articles


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