完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsieh, Sheng-Hsun | en_US |
dc.contributor.author | Li, Yung-Hui | en_US |
dc.contributor.author | Tien, Chung-Hao | en_US |
dc.date.accessioned | 2019-04-03T06:37:13Z | - |
dc.date.available | 2019-04-03T06:37:13Z | - |
dc.date.issued | 2016-12-01 | en_US |
dc.identifier.issn | 1424-8220 | en_US |
dc.identifier.uri | http://dx.doi.org/10.3390/s16121994 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/133090 | - |
dc.description.abstract | For many practical applications of image sensors, how to extend the depth-of-field (DoF) is an important research topic; if successfully implemented, it could be beneficial in various applications, from photography to biometrics. In this work, we want to examine the feasibility and practicability of a well-known "extended DoF" (EDoF) technique, or "wavefront coding," by building real-time long-range iris recognition and performing large-scale iris recognition. The key to the success of long-range iris recognition includes long DoF and image quality invariance toward various object distance, which is strict and harsh enough to test the practicality and feasibility of EDoF-empowered image sensors. Besides image sensor modification, we also explored the possibility of varying enrollment/testing pairs. With 512 iris images from 32 Asian people as the database, 400-mm focal length and F/6.3 optics over 3 m working distance, our results prove that a sophisticated coding design scheme plus homogeneous enrollment/testing setups can effectively overcome the blurring caused by phase modulation and omit Wiener-based restoration. In our experiments, which are based on 3328 iris images in total, the EDoF factor can achieve a result 3.71 times better than the original system without a loss of recognition accuracy. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | wavefront coding | en_US |
dc.subject | extended depth of field | en_US |
dc.subject | iris recognition | en_US |
dc.subject | biometrics | en_US |
dc.title | Test of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometrics | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.3390/s16121994 | en_US |
dc.identifier.journal | SENSORS | en_US |
dc.citation.volume | 16 | en_US |
dc.citation.issue | 12 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000391303000014 | en_US |
dc.citation.woscount | 1 | en_US |
顯示於類別: | 期刊論文 |