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dc.contributor.authorChung, SHen_US
dc.contributor.authorKang, HYen_US
dc.contributor.authorPearn, WLen_US
dc.date.accessioned2014-12-08T15:18:31Z-
dc.date.available2014-12-08T15:18:31Z-
dc.date.issued2005-09-01en_US
dc.identifier.issn0268-3768en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s00170-003-2028-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/13327-
dc.description.abstractThis paper considers the control wafers safety inventory problem (CWSIP) in the wafer fabrication photolithography area. The objective is to minimize the total cost of control wafers, where the cost includes new wafers cost, re-entrant cost and holding cost while maintaining the same level of production throughput. For the problem under pulling control production environment, a nonlinear programming model is presented to set safety inventory levels so as to minimize total cost of control wafers. A numerical example is given to illustrate the practicality of the model. The results demonstrate that the proposed model is an effective tool for determining the service level of safety inventory of control wafers for each grade.en_US
dc.language.isoen_USen_US
dc.subjectcontrol wafersen_US
dc.subjectnonlinear programming modelen_US
dc.subjectpull controlen_US
dc.subjectsafety inventoryen_US
dc.subjectservice levelen_US
dc.titleA service level model for the control wafers safety inventory problemen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s00170-003-2028-9en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGYen_US
dc.citation.volume26en_US
dc.citation.issue5-6en_US
dc.citation.spage591en_US
dc.citation.epage597en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000231605200020-
dc.citation.woscount2-
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