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dc.contributor.authorChung, Chen-Chenen_US
dc.contributor.authorLo, Hsiao-Chiehen_US
dc.contributor.authorLin, Yen-Kuen_US
dc.contributor.authorYu, Hung-Weien_US
dc.contributor.authorBinh Tinh Tranen_US
dc.contributor.authorLin, Kung-Liangen_US
dc.contributor.authorChen, Yung Changen_US
dc.contributor.authorNguyen-Hong Quanen_US
dc.contributor.authorChang, Edward Yien_US
dc.contributor.authorTseng, Yuan-Chiehen_US
dc.date.accessioned2017-04-21T06:55:33Z-
dc.date.available2017-04-21T06:55:33Z-
dc.date.issued2015-05en_US
dc.identifier.issn2053-1591en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2053-1591/2/5/055505en_US
dc.identifier.urihttp://hdl.handle.net/11536/133378-
dc.description.abstractThis work reports a fabrication strategy to improve the antireflective ability of a InGaP/GaAs/Ge triple-junction solar cell, by combining a nano-templating technique and a chemical-synthesis approach. SiH4 and N-2 were used as ammonia-free reaction gases in a plasma-enhanced chemical vapor deposition (PECVD) to prepare Si3N4 as an original antireflective coating (ARC) layer with better chemical stability. Composition-graded SiNx was successfully integrated with sub-wavelength structure by modulating SiH4/N-2 ratio during PECVD deposition, and followed by a controllable gold-nanoparticle masking technique on top of the solar cell. Finite-difference time-domain solution was employed to simulate and optimize the aspect-ratio of the ARC, under the condition of variable refractive index over a broad wavelength window, and followed by the masking technique to obtain the desired ARC dimension. This enabled a low light reflectance (<10%) over a broad spectral bandwidth (300-1800 nm) for the solar cell with excellent stability, because of the triple advantages of structural optimization, better chemical stability and graded refractive index of the ARC. The solar cell\'s performance was tested and showed great competitiveness to those of forefront studies, suggesting the feasibility of the proposed technology.en_US
dc.language.isoen_USen_US
dc.subjectsolar cellen_US
dc.subjectsub wavelength structureen_US
dc.subjectantireflectionen_US
dc.titleBroadband antireflection sub-wavelength structure of InGaP/InGaAs/Ge triple junction solar cell with composition-graded SiNxen_US
dc.identifier.doi10.1088/2053-1591/2/5/055505en_US
dc.identifier.journalMATERIALS RESEARCH EXPRESSen_US
dc.citation.volume2en_US
dc.citation.issue5en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000370018500019en_US
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