完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLi, Wei-Shuoen_US
dc.contributor.authorChen, Chun-Weien_US
dc.contributor.authorLin, Kuo-Fengen_US
dc.contributor.authorChen, Hou-Renen_US
dc.contributor.authorTsai, Chih-Yaen_US
dc.contributor.authorChen, Chyong-Huaen_US
dc.contributor.authorHsieh, Wen-Fengen_US
dc.date.accessioned2017-04-21T06:56:31Z-
dc.date.available2017-04-21T06:56:31Z-
dc.date.issued2016-04-01en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OL.41.001616en_US
dc.identifier.urihttp://hdl.handle.net/11536/133428-
dc.description.abstractPhase recovery by solving the transport-of-intensity equation (TIE) is a non-iterative and non-interferometric phase retrieval technique. From solving the TIE with conventional, one partial derivative and Hilbert transform methods for both the periodic and aperiodic samples, we demonstrate that the Hilbert transform method can provide the smoother phase images with edge enhancement and fine structures. Furthermore, compared with the images measured by optical and atomic force microscopy, the Hilbert transform method has the ability to quantitatively map out the phase images for both the periodic and aperiodic structures. (C) 2016 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titlePhase retrieval by using the transport-of-intensity equation with Hilbert transformen_US
dc.identifier.doi10.1364/OL.41.001616en_US
dc.identifier.journalOPTICS LETTERSen_US
dc.citation.volume41en_US
dc.citation.issue7en_US
dc.citation.spage1616en_US
dc.citation.epage1619en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000373225400079en_US
顯示於類別:期刊論文