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dc.contributor.authorWu, Tsan-Peien_US
dc.contributor.authorWang, Xiao-Qunen_US
dc.contributor.authorGuo, Guang-Yuen_US
dc.contributor.authorAnders, Frithjofen_US
dc.contributor.authorChung, Chung-Houen_US
dc.date.accessioned2017-04-21T06:56:23Z-
dc.date.available2017-04-21T06:56:23Z-
dc.date.issued2016-05-05en_US
dc.identifier.issn0953-8984en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0953-8984/28/17/175003en_US
dc.identifier.urihttp://hdl.handle.net/11536/133623-
dc.description.abstractThe quantum criticality of the two-lead two-channel pseudogap Anderson impurity model is studied. Based on the non-crossing approximation (NCA) and numerical renormalization group (NRG) approaches, we calculate both the linear and nonlinear conductance of the model at finite temperatures with a voltage bias and a power-law vanishing conduction electron density of states, rho(c)(omega) alpha | omega-mu(F)|(r) (0 < r < 1) near the Fermi energy mu(F). At a fixed leadimpurity hybridization, a quantum phase transition from the two-channel Kondo (2CK) to the local moment (LM) phase is observed with increasing r from r = 0 to r = r(c) < 1. Surprisingly, in the 2CK phase, different power-law scalings from the well-known root T or root V form is found. Moreover, novel power-law scalings in conductances at the 2CK-LM quantum critical point are identified. Clear distinctions are found on the critical exponents between linear and non-linear conductance at criticality. The implications of these two distinct quantum critical properties for the non-equilibrium quantum criticality in general are discussed.en_US
dc.language.isoen_USen_US
dc.subjectquantum criticalityen_US
dc.subjecttwo-channel Kondo physicsen_US
dc.subjectquantum phase transitionsen_US
dc.subjectnon-equilibrium quantum transporten_US
dc.titleQuantum criticality of the two-channel pseudogap Anderson model: universal scaling in linear and non-linear conductanceen_US
dc.identifier.doi10.1088/0953-8984/28/17/175003en_US
dc.identifier.journalJOURNAL OF PHYSICS-CONDENSED MATTERen_US
dc.citation.volume28en_US
dc.citation.issue17en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000374393100003en_US
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