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dc.contributor.authorLin, Chun-Chengen_US
dc.contributor.authorKang, Jia-Rongen_US
dc.contributor.authorHou, Chung-Chihen_US
dc.contributor.authorCheng, Chen -Yangen_US
dc.date.accessioned2017-04-21T06:55:32Z-
dc.date.available2017-04-21T06:55:32Z-
dc.date.issued2016-05en_US
dc.identifier.issn0360-8352en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.cie.2016.03.009en_US
dc.identifier.urihttp://hdl.handle.net/11536/133631-
dc.description.abstractIn picking product items in a warehouse to fulfill customer orders, a practical way is to classify similar orders as the same batch and then to plan the optimal picker routing when picking each batch of items. Different from the previous problems, this work investigates the joint order batching and picker Manhattan routing problem, which simultaneously determines the optimal order batching allocation and the shortest picker Manhattan routing that cannot pass through storage shelves in the warehouse, under some practical constraints. This work further addresses this problem by particle swarm optimization with bad experience to avoid bad solutions, in which a novel solution representation is designed for simultaneously handling both order batching and picker routing. The idea of the design is to transform the warehouse floorplan into a grid, in which virtual order center and batch center are defined to represent symbolic positions of orders and batches of the solution, respectively. By calculating the distance between the two centers, similar orders are categorized as the same batch. Additionally, theoretical analysis of convergence and stability of the proposed approach is also derived. Performance of this approach is evaluated via comprehensive experimental analysis and a case study. (C) 2016 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectOrder pickingen_US
dc.subjectOrder batchingen_US
dc.subjectParticle swarm optimizationen_US
dc.subjectLogisticsen_US
dc.subjectWarehouse managementen_US
dc.titleJoint order batching and picker Manhattan routing problemen_US
dc.identifier.doi10.1016/j.cie.2016.03.009en_US
dc.identifier.journalCOMPUTERS & INDUSTRIAL ENGINEERINGen_US
dc.citation.volume95en_US
dc.citation.spage164en_US
dc.citation.epage174en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000374365400016en_US
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