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dc.contributor.authorChung, Ting-Yien_US
dc.contributor.authorHuang, Szu-Jungen_US
dc.contributor.authorFu, Huang-Wenen_US
dc.contributor.authorChang, Ho-Pingen_US
dc.contributor.authorChang, Cheng-Hsiangen_US
dc.contributor.authorHwang, Ching-Shiangen_US
dc.date.accessioned2017-04-21T06:55:52Z-
dc.date.available2017-04-21T06:55:52Z-
dc.date.issued2016-08-01en_US
dc.identifier.issn0168-9002en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.nima.2016.04.030en_US
dc.identifier.urihttp://hdl.handle.net/11536/133717-
dc.description.abstractThe effect of an APPLE II-type elliptically polarized undulator (EPU) on the beam dynamics were investigated using active and passive methods. To reduce the tune shift and improve the injection efficiency, dynamic multipole errors were compensated using L-shaped iron shims, which resulted in stable top-up operation for a minimum gap. The skew quadrupole error was compensated using a multipole corrector, which was located downstream of the EPU for minimizing betatron coupling, and it ensured the enhancement of the synchrotron radiation brightness. The investigation methods, a numerical simulation algorithm, a multipole error correction method, and the beam-based measurement results are discussed. (C) 2016 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectAPPLE IIen_US
dc.subjectEPUen_US
dc.subjectDynamic multipoleen_US
dc.subjectCouplingen_US
dc.subjectSkew quadrupoleen_US
dc.titleActive and passive compensation of APPLE II-introduced multipole errors through beam-based measurementen_US
dc.identifier.doi10.1016/j.nima.2016.04.030en_US
dc.identifier.journalNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENTen_US
dc.citation.volume826en_US
dc.citation.spage48en_US
dc.citation.epage54en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000376887100007en_US
Appears in Collections:Articles