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dc.contributor.authorHuang, Wei-Hengen_US
dc.contributor.authorWang, Hsiuyingen_US
dc.contributor.authorYeh, Arthur B.en_US
dc.date.accessioned2017-04-21T06:55:15Z-
dc.date.available2017-04-21T06:55:15Z-
dc.date.issued2016-06en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://dx.doi.org/10.1002/qre.1841en_US
dc.identifier.urihttp://hdl.handle.net/11536/133757-
dc.description.abstractAmong a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice. Copyright (c) 2015 John Wiley & Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.subjectaverage run lengthen_US
dc.subjectlognormal distributionen_US
dc.subjectX-charten_US
dc.titleControl Charts for the Lognormal Meanen_US
dc.identifier.doi10.1002/qre.1841en_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.citation.volume32en_US
dc.citation.issue4en_US
dc.citation.spage1407en_US
dc.citation.epage1416en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.identifier.wosnumberWOS:000374681200011en_US
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