標題: | Degradation of InGaN/GaN LEDs under Forward-bias Operations in Salty Water Vapor |
作者: | Chen, Hsiang Hsieh, Kun Min He, Yun Yang Chu, Li Chen Lee, Ming Ling Chang, Kow Ming 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Green InGaN/GaN LED;Salty Water Vapor;Forward-bias;Corrosion;Au diffussion |
公開日期: | 2016 |
摘要: | Forward-bias stress in salty water vapor can quickly degrade the InGaN/GaN LEDs. To examine the weakness of the device, electrical, optical, and material analyses and characterizations were performed to investigate the failure mechanism. Corrosion of the electrode and Au atom diffusion might result in damages of the device. Results indicate that forward-bias stress in salty water vapor can quickly influence the material properties, optical behaviors, and electrical characteristics of the LED device. |
URI: | http://hdl.handle.net/11536/133976 |
ISSN: | 1480-2422 |
期刊: | JOURNAL OF NEW MATERIALS FOR ELECTROCHEMICAL SYSTEMS |
Volume: | 19 |
Issue: | 1 |
起始頁: | 7 |
結束頁: | 10 |
顯示於類別: | 期刊論文 |