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dc.contributor.authorLin, YGen_US
dc.contributor.authorWu, CHen_US
dc.contributor.authorTyan, SLen_US
dc.contributor.authorLin, SDen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:18:38Z-
dc.date.available2014-12-08T15:18:38Z-
dc.date.issued2005-08-10en_US
dc.identifier.issn0217-9849en_US
dc.identifier.urihttp://dx.doi.org/10.1142/S021798490500892Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/13403-
dc.description.abstractThe InAs/GaAs quantum dots (QDs) with a baselength of less than 10 nm are studied by the excitation-, temperature-dependent and magneto-photoluminescence (PL). The baselengths of the QDs, calculated by the PL ground state transition energy and estimated by magneto-PL spectra, axe in agreement with the result of atomic force microscopy measurements. By means of the excitation-dependent PL, we demonstrate that only the ground electron and hole states exist when the baselength of the QDs is smaller than about 7.3 nm, whereas the larger dots with a baselength of about 8.7 nm will give rise to one excited hole state. The measured energy separation between the ground and the excited hole states is in good agreement with the theoretical calculation. The transition energy in temperature-dependent PL spectra shows a rapid redshift as the temperature is higher than the critical temperature. The redshift rate is about 2.8 and 2.5 times larger than the values calculated by Varshni's law for small and large dots respectively. The higher redshift rate can be explained by the stronger tunneling effect. In addition, the PL linewidths show a V-shape dependence with the temperature. This behavior could be well described as a tunneling and electron-phonon scattering effect.en_US
dc.language.isoen_USen_US
dc.subjectexcitation-dependenten_US
dc.subjectPLen_US
dc.subjectInAsen_US
dc.subjectQDen_US
dc.subjectredshiften_US
dc.subjecttunnelingen_US
dc.subjectscatteringen_US
dc.titlePhotoluminescence of ultra small InAs/GaAs quantum dotsen_US
dc.typeArticleen_US
dc.identifier.doi10.1142/S021798490500892Xen_US
dc.identifier.journalMODERN PHYSICS LETTERS Ben_US
dc.citation.volume19en_US
dc.citation.issue18en_US
dc.citation.spage907en_US
dc.citation.epage917en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000232706700005-
dc.citation.woscount1-
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