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dc.contributor.authorHsiao, Chih-Jenen_US
dc.contributor.authorMinh-Thien-Huu Haen_US
dc.contributor.authorHsu, Ching-Yien_US
dc.contributor.authorLin, Yueh-Chinen_US
dc.contributor.authorChang, Sheng-Poen_US
dc.contributor.authorChang, Shoou-Jinnen_US
dc.contributor.authorChang, Edward Yien_US
dc.date.accessioned2017-04-21T06:55:20Z-
dc.date.available2017-04-21T06:55:20Z-
dc.date.issued2016-09en_US
dc.identifier.issn1882-0778en_US
dc.identifier.urihttp://dx.doi.org/10.7567/APEX.9.095502en_US
dc.identifier.urihttp://hdl.handle.net/11536/134254-
dc.description.abstractGaSb epitaxial layers were directly grown on GaAs substrates by metal-organic chemical vapor deposition involving Sb interfacial treatment with optimized growth temperature and V/III ratio. The interfacial treatment effectively reduces the surface energy and strain energy difference, resulting in a quasi-2D growth mode. When the GaSb layer was grown at 520 degrees C, the strain induced by lattice mismatch was accommodated by 90 degrees dislocations with a period of 5.67 nm. By optimizing the V/III ratio, the surface roughness of the ultrathin GaSb/GaAs heterostructure was reduced, resulting in a reduced carrier scattering and improved electronic properties. (C) 2016 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleGrowth of ultrathin GaSb layer on GaAs using metal-organic chemical vapor deposition with Sb interfacial treatmenten_US
dc.identifier.doi10.7567/APEX.9.095502en_US
dc.identifier.journalAPPLIED PHYSICS EXPRESSen_US
dc.citation.volume9en_US
dc.citation.issue9en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000383983700023en_US
Appears in Collections:Articles