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dc.contributor.authorWei, Chun-Shuen_US
dc.contributor.authorWang, Yu-Teen_US
dc.contributor.authorLin, Chin-Tengen_US
dc.contributor.authorJung, Tzyy-Pingen_US
dc.date.accessioned2017-04-21T06:49:19Z-
dc.date.available2017-04-21T06:49:19Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4244-9270-1en_US
dc.identifier.issn1557-170Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/134302-
dc.description.abstractRecent advances in mobile electroencephalogram (EEG) acquisition based on dry electrodes have started moving Brain-Computer Interface (BCI) applications from well-controlled laboratory settings to real-world environments. However, the application mechanisms and high impedance of dry electrodes over the hair-covered areas remain challenging for everyday use of BCI. In addition, whole-scalp recordings are not always necessary or applicable due to various practical constrains. Therefore, alternative montages for EEG recordings to meet the everyday needs are in-demand. Inspired by our previous work on measuring non-hair-bearing steady state visual evoked potentials for BCI applications, this study explores the feasibility and efficacy of detecting cognitive lapses of participants based on EEG signals collected from the non-hair-bearing areas. Study results suggest that informative EEG features associated with lapses could be assessed from non-hair-bearing areas with comparable accuracy obtained from the whole-scalp EEG. The design principles, validation processes and promising findings reported in this study may enable and/or facilitate numerous BCI applications in real-world environments.en_US
dc.language.isoen_USen_US
dc.titleToward Non-Hair-Bearing Brain-Computer Interfaces for Neurocognitive Lapse Detectionen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 37TH ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC)en_US
dc.citation.spage6638en_US
dc.citation.epage6641en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department腦科學研究中心zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentBrain Research Centeren_US
dc.identifier.wosnumberWOS:000371717206223en_US
dc.citation.woscount0en_US
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