Full metadata record
DC FieldValueLanguage
dc.contributor.authorChen, Yu-Taen_US
dc.contributor.authorMang Ou-Yangen_US
dc.contributor.authorWu, Shuen-Deen_US
dc.contributor.authorLin, Shiou-Gwoen_US
dc.contributor.authorKuo, Yi-Tingen_US
dc.contributor.authorLee, Cheng-Chungen_US
dc.date.accessioned2017-04-21T06:50:03Z-
dc.date.available2017-04-21T06:50:03Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4577-1771-0en_US
dc.identifier.issn1091-5281en_US
dc.identifier.urihttp://hdl.handle.net/11536/134386-
dc.description.abstractStatic fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.en_US
dc.language.isoen_USen_US
dc.subjectstatic fringe analysisen_US
dc.subjectoptical testingen_US
dc.subjectensemble empirical mode decompositionen_US
dc.titleUsing Ensemble Empirical Mode Decomposition to Improve the Static Fringe Analysis in Optical Testingen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)en_US
dc.citation.spage249en_US
dc.citation.epage253en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000309449100049en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper