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dc.contributor.authorWang, Senen_US
dc.contributor.authorWu, Hsien-Shunen_US
dc.contributor.authorChang, Chi-Hoen_US
dc.contributor.authorTzuang, Ching-Kuang C.en_US
dc.date.accessioned2017-04-21T06:49:44Z-
dc.date.available2017-04-21T06:49:44Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0687-6en_US
dc.identifier.issn0149-645Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/134449-
dc.description.abstractAn electromagnetic (EM) model for investigating the substrate coupling of the CMOS FMCW sensor is presented. Such EM model, which invokes the large-scale field analyses, can make a quantitative assessment of the EM coupling and can be applied into the system simulations for designing the CMOS FMCW sensor. A practical example is reported to demonstrate the feasibility of the proposed model. Furthermore, the model is applied to validate the effectiveness of the chip-scale leakage suppression by incorporating the complementary conducting strips transmission line (CCS-TL). The system simulations, which are performed with the proposed EM model, compared with those of the experimental results, showing a slight difference of 2.6dB on the prediction of the isolation improvement.en_US
dc.language.isoen_USen_US
dc.subjectCMOSen_US
dc.subjectsubstrate couplingen_US
dc.subjecttransmission lineen_US
dc.subjectFMCW sensoren_US
dc.titleModeling and suppressing substrate coupling of RF CMOS FMCW sensor incorporating synthetic quasi-TEM transmission linesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6en_US
dc.citation.spage1930en_US
dc.citation.epage+en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000250827405018en_US
dc.citation.woscount0en_US
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