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| Investigation of Abnormal Off-Current in p-Channel Double Diffused Drain Metal-Oxide-Semiconductor Transistors after Hot Carrier Stress | 1 |
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| Investigation of Abnormal Off-Current in p-Channel Double Diffused Drain Metal-Oxide-Semiconductor Transistors after Hot Carrier Stress | 1 |
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| 俄羅斯聯邦 | 1 |
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