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dc.contributor.authorKuan, Chin-Ien_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorLi, Pei-Wenen_US
dc.contributor.authorHuang, Tiao-Yuanen_US
dc.date.accessioned2017-04-21T06:48:46Z-
dc.date.available2017-04-21T06:48:46Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-5090-0726-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/134677-
dc.description.abstractShort-channel zinc oxynitride (ZnON) thin-film transistors (TFTs) were fabricated based on the film profile engineering in combination with e-beam lithographical patterning. ZnON films were deposited using reactive magnetron sputtering in N-2/O-2 ambient and exhibit a Hall mobility of 95 cm(2)/V-s. A ZnON TFT with channel length of 147nm shows high on/off current ratio of 5x10(7) and field-effect mobility of 9.1 cm(2)/Vs, which are superior or comparable to their counterparts of IGZO or ZnO TFTs.en_US
dc.language.isoen_USen_US
dc.titleShort-Channel ZnON Thin-Film Transistors with Film Profile Engineeringen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW)en_US
dc.citation.spage66en_US
dc.citation.epage67en_US
dc.contributor.department電機學院zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000391250500029en_US
dc.citation.woscount0en_US
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