完整後設資料紀錄
DC 欄位語言
dc.contributor.authorYang, Te-Fuen_US
dc.contributor.authorHuang, Ru-Yuen_US
dc.contributor.authorSu, Yi-Pingen_US
dc.contributor.authorBalakumaren_US
dc.contributor.authorChen, Ke-Horngen_US
dc.contributor.authorTsai, Tsung-Yenen_US
dc.contributor.authorLin, Jian-Ruen_US
dc.contributor.authorLin, Ying-Hsien_US
dc.contributor.authorLee, Chao-Chengen_US
dc.contributor.authorTseng, Pei-Lingen_US
dc.date.accessioned2017-04-21T06:49:02Z-
dc.date.available2017-04-21T06:49:02Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-8391-9en_US
dc.identifier.issn0271-4302en_US
dc.identifier.urihttp://hdl.handle.net/11536/134712-
dc.description.abstractImplantable devices like artificial cardiac pacemakers are generally used to control irregular pulses of heart. For 10-year usage, high accuracy supply voltage is essential with the unavoidable aging of the power system to achieve near-natural beat rhythm. A Self-Calibration DC-DC Buck converter (SC-Buck) is proposed to achieve high output voltage accuracy by eliminating offset caused by mismatch of process, voltage and temperature (PVT). Furthermore, the discontinuity which affects transient performance in conventional offset cancellation is also overcome. Large area occupation, which is required to decrease mismatch in conventional operational amplifier, can be largely decreased according to Monte Carlo analysis. Without trimming process, the proposed SC-Buck technique achieves high accuracy for long-term usage (years) and low cost. The test chip fabricated in UMC 28nm CMOS process proves the output voltage accuracy of 97% since the mismatch of error amplifier can be suppressed from 122% to 1%.en_US
dc.language.isoen_USen_US
dc.subjectbuck converteren_US
dc.subjectself-calibrationen_US
dc.subjectmismatchen_US
dc.subjectoffseten_US
dc.titleImplantable Biomedical Device Supplying by a 28nm CMOS Self-Calibration DC-DC Buck Converter with 97% Output Voltage Accuracyen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)en_US
dc.citation.spage1366en_US
dc.citation.epage1369en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000371471001162en_US
dc.citation.woscount0en_US
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