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dc.contributor.authorWu, CCen_US
dc.contributor.authorLin, CJen_US
dc.date.accessioned2014-12-08T15:01:14Z-
dc.date.available2014-12-08T15:01:14Z-
dc.date.issued1998en_US
dc.identifier.issn0204-3467en_US
dc.identifier.urihttp://hdl.handle.net/11536/134-
dc.description.abstractThe quantum theory of free-carrier absorption in heavily doped semiconductors has been extended to treat the case where the electrons are confined in quasi-two-dimensional (2D) semiconducting structures such as n-type degenerate InSb films. It is assumed that the energy band of electrons in semiconductors is nonparabolic. The free-carrier absorption coefficient is shown to depend upon the polarization of the electromagnetic radiation relative to the direction normal to the quasi-2D structure, the film thickness, and the phonon frequency. When the dominant mechanism of the electron-phonon scattering is the deformation-potential coupling, some oscillations of the free-carrier absorption coefficient with the photon frequency or the film thickness can be observed in a small film thickness range d < 120 Angstrom. While the piezoelectric coupling is the dominant mechanism of the electron-phonon scattering, the oscillations of the free-carrier absorption coefficient with the phonon frequency or the film thickness can be observed in a larger film thickness range d < 1.5 x 10(3) Angstrom. Some oscillations of the free-carrier absorption coefficient with the phonon frequency or the film. thickness are different from those in nondegenerate semiconductors.en_US
dc.language.isoen_USen_US
dc.titleFree-carrier absorption in heavily doped quasi-two-dimensional semiconducting structuresen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.journalPHYSICS OF LOW-DIMENSIONAL STRUCTURESen_US
dc.citation.volume1-2en_US
dc.citation.spage281en_US
dc.citation.epage286en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000072938400037-
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