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dc.contributor.authorChen, KMen_US
dc.contributor.authorPeng, ASen_US
dc.contributor.authorHuang, GWen_US
dc.contributor.authorChen, HYen_US
dc.contributor.authorHuang, SYen_US
dc.contributor.authorChang, CYen_US
dc.contributor.authorTseng, HCen_US
dc.contributor.authorHsu, TLen_US
dc.contributor.authorLiang, Ven_US
dc.date.accessioned2014-12-08T15:18:48Z-
dc.date.available2014-12-08T15:18:48Z-
dc.date.issued2005-07-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2005.850633en_US
dc.identifier.urihttp://hdl.handle.net/11536/13513-
dc.description.abstractIn this paper, the power gain, power-added efficiency (PAE) and linearity of power SiGe heterojunction-bipolar transistors at various temperatures have been presented. The power characteristics were measured using a two-tone load-pull system. For transistors biased with fixed base voltage, the small-signal power gain and PAE of the devices increase with increasing temperature at low base voltages, while they decrease at high base voltages. Besides, the linearity is improved at high temperature for all voltage biases. However, for devices with fixed collector current, the small-signal power gain, PAE, and linearity are nearly unchanged with temperature. The temperature dependence of power and linearity characteristics can be understood by analyzing the cutoff frequency, the collector current, Kirk effect and nonlinearities of transconductance at different temperatures.en_US
dc.language.isoen_USen_US
dc.subjectlinearityen_US
dc.subjectpower-added efficiencyen_US
dc.subjectpower gainen_US
dc.subjectSiGeHBTen_US
dc.subjecttemperatureen_US
dc.titleLinearity and power characteristics of SiGeHBTs at high temperatures for RF applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2005.850633en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume52en_US
dc.citation.issue7en_US
dc.citation.spage1452en_US
dc.citation.epage1458en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000230123100023-
dc.citation.woscount8-
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