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dc.contributor.authorLiu, Li-changen_US
dc.contributor.authorLee, Jiann-deren_US
dc.contributor.authorHsu, Yu-weien_US
dc.contributor.authorLiu, Carol T.en_US
dc.contributor.authorTseng, Ellenen_US
dc.contributor.authorTsai, Meng-Tsanen_US
dc.date.accessioned2017-04-21T06:50:18Z-
dc.date.available2017-04-21T06:50:18Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4673-5253-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/135363-
dc.description.abstractThis paper describes a novel region segmentation method designed to avoid complications of the threshold process used in traditional segmentation methods in 2-D optical coherence tomography (OCT) images. Analysis of the layers and regions in OCT images is used to diagnose the presence of cancer and identify the stage of the cancer if present. However, scattering during OCT images generates a speckle effect and creates diffusion problems which are also captured; these problems cause traditional image processing methods such as the Canny edge and Otsu methods to fail in finding the proper layer and region edges. The proposed method uses the mean value and an enhanced-fuzzy-c-mean algorithm to cluster pixels in 2-D OCT images and find the edge between different clustered regions. Low-resolution vessel OCT and high-resolution oral cancer OCT images are tested in the experiment, and the experimental results show that the proposed method performs with more robust and accurate segmentation results than does the overcomplete-wavelet-frame-based fractal signature method.en_US
dc.language.isoen_USen_US
dc.subjectOptical coherence tomographyen_US
dc.subjectOCTen_US
dc.subjecttexture segmentationen_US
dc.subjectfuzzy-c-meanen_US
dc.subjectvesselen_US
dc.titleA Region Segmentation Method on 2-D Vessel Optical Coherence Tomography Imagesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 10TH INTERNATIONAL CONFERENCE ON FUZZY SYSTEMS AND KNOWLEDGE DISCOVERY (FSKD)en_US
dc.citation.spage338en_US
dc.citation.epage343en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000341633700055en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper