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dc.contributor.authorShen, Chang-Hongen_US
dc.contributor.authorShieh, Jia-Minen_US
dc.contributor.authorWu, Tsung-Taen_US
dc.contributor.authorHuang, Wen-Hsienen_US
dc.contributor.authorYang, Chih-Chaoen_US
dc.contributor.authorWan, Chih-Jenen_US
dc.contributor.authorLin, Chein-Dinen_US
dc.contributor.authorWang, Hsing-Hsiangen_US
dc.contributor.authorChen, Bo-Yuanen_US
dc.contributor.authorHuang, Guo-Weien_US
dc.contributor.authorLien, Yu-Chungen_US
dc.contributor.authorWong, Simonen_US
dc.contributor.authorWang, Chiehen_US
dc.contributor.authorLai, Yin-Chiehen_US
dc.contributor.authorChen, Chien-Fuen_US
dc.contributor.authorChang, Meng-Fanen_US
dc.contributor.authorHu, Chenmingen_US
dc.contributor.authorYang, Fu-Liangen_US
dc.date.accessioned2017-04-21T06:49:48Z-
dc.date.available2017-04-21T06:49:48Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4799-2306-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/135418-
dc.description.abstractFor the first time, a sequentially processed sub-50nm monolithic 3D IC with integrated logic/NVM circuits and SRAM is demonstrated using multiple layers of ultrathin-body (UTB) MOSFET-based circuits interconnected through 300nm-thick interlayer dielectric (ILD). High-performance sub-50nm UTB MOSFETs using deposited ultra-flat and ultra-thin (20nm) epi-like Si enable across-layer and in-layer high-speed 3ps logic circuits and 1-T 500ns plasma-MONOS NVMs as well as 6T SRAMs with static noise margin (SNM) of 280 mV and reduced footprint by 25%. Closely stacked monolithic 3D circuits envision advanced high-performance, rich function, and low power intelligent mobile devices.en_US
dc.language.isoen_USen_US
dc.titleMonolithic 3D Chip Integrated with 500ns NVM, 3ps Logic Circuits and SRAMen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000346509500056en_US
dc.citation.woscount0en_US
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