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dc.contributor.authorHung, Shao-Fengen_US
dc.contributor.authorLin, Long-Yien_US
dc.contributor.authorHong, Hao-Chiaoen_US
dc.date.accessioned2017-04-21T06:49:55Z-
dc.date.available2017-04-21T06:49:55Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4673-2988-0en_US
dc.identifier.isbn978-1-4673-2989-7en_US
dc.identifier.issn2163-9612en_US
dc.identifier.urihttp://hdl.handle.net/11536/135495-
dc.description.abstractThis paper demonstrates an efficient diagnosis-after-test (DAT) procedure for testing the Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. For typical switched-capacitor (SC) filter design, the transfer functions are mainly determined by capacitor ratios. Therefore, the practical capacitor ratios are important parameters for designers to diagnose their designs. The DAT procedure can not only test for the real transfer function of the SC biquad for making reliable pass/fail decision without conducting many tests, but also diagnose the capacitor ratios of the SC biquad. With the diagnosis results, designers can find out which capacitors cause the failure and revise the design for a better yield. Mathematical analysis shows that the entire DAT procedure requires only a three-tone test, which implies a very short test time. A second-order low-pass filter adopting the E-circuit of the Fleischer-Laker SC biquad is taken as a test example. Simulation results show the DAT procedure can provide good test accuracy with the three-tone test data. In addition, the test achieves a 100% parametric fault coverage of the capacitor ratios defined by the SLB fault model for the Fleischer-Laker SC biquad.en_US
dc.language.isoen_USen_US
dc.titleTesting the Fleischer-Laker Switched-Capacitor Biquad Using the Diagnosis-After-Test Procedureen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC)en_US
dc.citation.spage179en_US
dc.citation.epage184en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000392919200046en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper