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dc.contributor.authorTeng, Li-Fengen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorFuh, Chur-Shyangen_US
dc.contributor.authorChou, Yi-Tehen_US
dc.contributor.authorLi, Fu-Haien_US
dc.contributor.authorChang, Chih-Hsiangen_US
dc.contributor.authorShieh, Han-Ping D.en_US
dc.date.accessioned2017-04-21T06:48:29Z-
dc.date.available2017-04-21T06:48:29Z-
dc.date.issued2011en_US
dc.identifier.issn1883-2490en_US
dc.identifier.urihttp://hdl.handle.net/11536/135533-
dc.description.abstractWe studied wavelength dependent photo-responses in amorphous nitrogenated InGaZnO thin-film transistors (a-IGZO:N TFTs). The a-IGZO:N active layer was deposited by dc reactive sputter with a nitrogen and argon gas mixture at room temperature and performed the superior characteristics while comparing with the intrinsic IGZO TFTs.en_US
dc.language.isoen_USen_US
dc.titleElectrical performance and photo-responses enhancement by in situ nitrogen incorporation to amorphous InGaZnO thin-film transistorsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalIDW'11: PROCEEDINGS OF THE 18TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3en_US
dc.citation.spage113en_US
dc.citation.epage115en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000393147800027en_US
dc.citation.woscount0en_US
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