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dc.contributor.authorLiang, Sheng-Fuen_US
dc.contributor.authorChang, Wan-Linen_US
dc.contributor.authorChiueh, Hermingen_US
dc.date.accessioned2017-04-21T06:48:32Z-
dc.date.available2017-04-21T06:48:32Z-
dc.date.issued2010en_US
dc.identifier.isbn978-1-4244-6917-8en_US
dc.identifier.issn2161-4393en_US
dc.identifier.urihttp://hdl.handle.net/11536/135561-
dc.description.abstractApproximately 1 % of people in the world have epilepsy and 25% of epilepsy patients cannot be treated sufficiently by any available therapy. An automatic seizure detection system can reduce the time taken to review the EEG data by the neurologist for epilepsy diagnosis. In this paper, various EEG features integrated with the linear or non-linear classifiers are evaluated for seizure detection. For the EEG features, approximate entropy (ApEn) combined with 1) EEG power spectra or 2) autoregressive model (AR) are compared. In addition, the principle component analysis (PCA) is also utilized for feature extraction. For the classifiers, two linear models, linear least square (LLS) and linear discriminant analysis (LDA), and two nonlinear models, backpropagation neural network (BPNN) and support vector machine with radial basis function kernel (RBFSVM) are compared. The EEG signals of three Long Evans rats with spontaneous absence seizures are used for leave-one-out cross-validation. Experimental results shows that combining ApEn and multi-band EEG power spectra are superior to the combination of ApEn and AR model for all classifiers. The best average accuracy is 97.5% performed by RBFSVM and the linear models can achieve to higher than 95%. The automatic seizure detection method can be utilized to drive the seizure warning device or seizure control devices in the future to enhance the patients\' quality of life.en_US
dc.language.isoen_USen_US
dc.subjectEpilepsyen_US
dc.subjectseizure detectionen_US
dc.subjectEEGen_US
dc.subjectfeature extractionen_US
dc.subjectlinear and nonlinear classifiersen_US
dc.titleEEG-based Absence Seizure Detection Methodsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2010 INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS IJCNN 2010en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000287421403068en_US
dc.citation.woscount0en_US
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