完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hwang, FK | en_US |
dc.date.accessioned | 2014-12-08T15:18:52Z | - |
dc.date.available | 2014-12-08T15:18:52Z | - |
dc.date.issued | 2005-06-15 | en_US |
dc.identifier.issn | 0166-218X | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.dam.2005.02.010 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/13581 | - |
dc.description.abstract | Consider a graph G (V, E) where a subset D E E is called the set of defective edges. The problem is to identify D with a small number of edge tests, where an edge test takes an arbitrary subset S and asks whether the subgraph G(S) induced by S intersects D (contains a defective edge). Recently, Johann gave an algorithm to find all d defective edges in a graph assuming d D I is known. We give an algorithm with d unknown which requires at most d([log(2) vertical bar E vertical bar] + 4) + 1 tests. The information-theoretic bound, knowing d, is about d log(2) (vertical bar E vertical bar/d). For d fixed, our algorithm is competitive with coefficient 1. (c) 2005 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | group testing | en_US |
dc.subject | graph testing | en_US |
dc.subject | competitive algorithm | en_US |
dc.title | A competitive algorithm to find all defective edges in a graph | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.dam.2005.02.010 | en_US |
dc.identifier.journal | DISCRETE APPLIED MATHEMATICS | en_US |
dc.citation.volume | 148 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 273 | en_US |
dc.citation.epage | 277 | en_US |
dc.contributor.department | 應用數學系 | zh_TW |
dc.contributor.department | Department of Applied Mathematics | en_US |
dc.identifier.wosnumber | WOS:000230062600007 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |