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dc.contributor.authorHwang, FKen_US
dc.date.accessioned2014-12-08T15:18:52Z-
dc.date.available2014-12-08T15:18:52Z-
dc.date.issued2005-06-15en_US
dc.identifier.issn0166-218Xen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.dam.2005.02.010en_US
dc.identifier.urihttp://hdl.handle.net/11536/13581-
dc.description.abstractConsider a graph G (V, E) where a subset D E E is called the set of defective edges. The problem is to identify D with a small number of edge tests, where an edge test takes an arbitrary subset S and asks whether the subgraph G(S) induced by S intersects D (contains a defective edge). Recently, Johann gave an algorithm to find all d defective edges in a graph assuming d D I is known. We give an algorithm with d unknown which requires at most d([log(2) vertical bar E vertical bar] + 4) + 1 tests. The information-theoretic bound, knowing d, is about d log(2) (vertical bar E vertical bar/d). For d fixed, our algorithm is competitive with coefficient 1. (c) 2005 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectgroup testingen_US
dc.subjectgraph testingen_US
dc.subjectcompetitive algorithmen_US
dc.titleA competitive algorithm to find all defective edges in a graphen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.dam.2005.02.010en_US
dc.identifier.journalDISCRETE APPLIED MATHEMATICSen_US
dc.citation.volume148en_US
dc.citation.issue3en_US
dc.citation.spage273en_US
dc.citation.epage277en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.identifier.wosnumberWOS:000230062600007-
dc.citation.woscount3-
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