Full metadata record
DC FieldValueLanguage
dc.contributor.authorChu, Li-Chengen_US
dc.contributor.authorYang, Te-Fuen_US
dc.contributor.authorHuang, Ru-Yuen_US
dc.contributor.authorSu, Yi-Pingen_US
dc.contributor.authorLin, Chiun-Heen_US
dc.contributor.authorWey, Chin-Longen_US
dc.contributor.authorChen, Ke-Horngen_US
dc.contributor.authorLin, Ying-Hsien_US
dc.contributor.authorLee, Chao-Chengen_US
dc.contributor.authorLin, Jian-Ruen_US
dc.contributor.authorTsai, Tsung-Yenen_US
dc.date.accessioned2017-04-21T06:48:25Z-
dc.date.available2017-04-21T06:48:25Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4673-7191-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/136013-
dc.description.abstractthe proposed deep-standby mode (DSM) is used in 28nm power management unit (PMU) for long-term usage in active implantable medical devices (AIMD). The PMU can upgrade its normal mode with the proposed embedded auto-cancellation (EAC) technique in order to have high accuracy even if the battery is aging and the PVT variations occur. The test chip fabricated in 28nm CMOS process features low quiescent current of 200nA and output voltage accuracy of 98%. Seamless transition among the DSM and the accurate mode demonstrates both low quiescent current and high accuracy can be achieved in the proposed PMU.en_US
dc.language.isoen_USen_US
dc.subjectdeep-standby mode (DSM)en_US
dc.subjectpower management unit (PMU)en_US
dc.subjectactive implantable medical devices (AIMD)en_US
dc.subjectembedded auto-cancellation (EAC)en_US
dc.title200nA Low Quiescent Current Deep-Standby Mode in 28nm DC-DC Buck Converter for Active Implantable Medical Devicesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)en_US
dc.citation.spage205en_US
dc.citation.epage208en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000380460000029en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper