完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lai, Kelvin Yi-Tse | en_US |
dc.contributor.author | Shiu, Ming-Feng | en_US |
dc.contributor.author | Lu, Yi-Wen | en_US |
dc.contributor.author | Ho, Yingchieh | en_US |
dc.contributor.author | Kao, Yu-Chi | en_US |
dc.contributor.author | Yang, Yu-Tao | en_US |
dc.contributor.author | Wang, Gary | en_US |
dc.contributor.author | Liu, Keng-Ming | en_US |
dc.contributor.author | Chang, Hsie-Chia | en_US |
dc.contributor.author | Lee, Chen-Yi | en_US |
dc.date.accessioned | 2017-04-21T06:48:25Z | - |
dc.date.available | 2017-04-21T06:48:25Z | - |
dc.date.issued | 2015 | en_US |
dc.identifier.isbn | 978-1-4673-7191-9 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/136014 | - |
dc.description.abstract | This paper presents a field programmable lab-on-a-chip (FPLOC) with microfluidics actuation, droplet location/category readback, built-in-self-test (BIST), and bioassays detection. This FPLOC is composed of 1,800 MEDA microelectrodes and integrates a set of microfluidic operations to perform droplet moving/cutting/mixing. Besides, capacitive sensing circuits are considered for system automation, droplets classification, malfunctioning microelectrodes and surface flatness testing, and biomedical detection. Implemented in 0.35 mu m standard CMOS process in 7.4mm(2), the FPLOC demonstrates microfluidic operations under 25V at 1KHz, 1.3fF resolution for droplet location/category/chip BIST maps readback at 1MHz, and 0.34fF sensitivity of capacitive measurement window for biomedical detection at 1KHz. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | EWOD | en_US |
dc.subject | MEDA | en_US |
dc.subject | FPLOC | en_US |
dc.subject | BIST | en_US |
dc.subject | CDC | en_US |
dc.title | A Field-Programmable Lab-on-a-Chip with Built-in Self-Test Circuit and Low-Power Sensor-Fusion Solution in 0.35 mu m Standard CMOS Process | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2015 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC) | en_US |
dc.citation.spage | 281 | en_US |
dc.citation.epage | 284 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000380460000048 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |