標題: Demonstration of 3D Vertical RRAM with Ultra Low-leakage, High-selectivity and Self-compliance Memory Cells
作者: Luo, Qing
Xu, Xiaoxin
Liu, Hongtao
Lv, Hangbing
Gong, Tiancheng
Long, Shibing
Liu, Qi
Sun, Haitao
Banerjee, Writam
Li, Ling
Gao, Jianfeng
Lu, Nianduan
Chung, Steve S.
Li, Jing
Liu, Ming
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2015
摘要: Developing high performance self-selective cell (SSC) is one of the most critical issues of the integration of 3D vertical RRAM (V-RRAM). In this work, a four-layer V-RRAM array, with high performance HfO2/mixed ionic and electronic conductor (MIEC) bilayer SSC, was demonstrated for the first time. Several salient features were achieved, including ultra-low half-select leakage (<0.1 pA), very high nonlinearity (>10(3)), low operation current (nA level), self-compliance, high endurance (>10(7)), and robust read/write disturbance immunity.
URI: http://hdl.handle.net/11536/136041
ISBN: 978-1-4673-9894-7
期刊: 2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
顯示於類別:會議論文