標題: | Demonstration of 3D Vertical RRAM with Ultra Low-leakage, High-selectivity and Self-compliance Memory Cells |
作者: | Luo, Qing Xu, Xiaoxin Liu, Hongtao Lv, Hangbing Gong, Tiancheng Long, Shibing Liu, Qi Sun, Haitao Banerjee, Writam Li, Ling Gao, Jianfeng Lu, Nianduan Chung, Steve S. Li, Jing Liu, Ming 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2015 |
摘要: | Developing high performance self-selective cell (SSC) is one of the most critical issues of the integration of 3D vertical RRAM (V-RRAM). In this work, a four-layer V-RRAM array, with high performance HfO2/mixed ionic and electronic conductor (MIEC) bilayer SSC, was demonstrated for the first time. Several salient features were achieved, including ultra-low half-select leakage (<0.1 pA), very high nonlinearity (>10(3)), low operation current (nA level), self-compliance, high endurance (>10(7)), and robust read/write disturbance immunity. |
URI: | http://hdl.handle.net/11536/136041 |
ISBN: | 978-1-4673-9894-7 |
期刊: | 2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) |
顯示於類別: | 會議論文 |