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dc.contributor.authorLiao, Jia-Juen_US
dc.contributor.authorChuang, Shang-Yien_US
dc.contributor.authorChou, Chia-Chingen_US
dc.contributor.authorChang, Chia-Chien_US
dc.contributor.authorFang, Wai-Chien_US
dc.date.accessioned2017-04-21T06:48:29Z-
dc.date.available2017-04-21T06:48:29Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-6275-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/136078-
dc.description.abstractThis study proposed an effective signal processing system based on Ensemble Empirical Mode Decomposition (EEMD) method for the analysis of Photoplethysmography (PPG). The whole system was implemented on an ARM-based SoC development platform to attain the on-line non-stationary signal processing. A non-invasive near-infrared light sensing device was used to record the continuous PPG as the input signal. According to the non-stationary characteristics of PPG, EEMD is useful to achieve accurate analysis for PPG. The signal was decomposed into several Intrinsic Mode Functions (IMFs) by EEMD. The results showed that the proposed EEMD processor can effectively solve the mode mixing problem of Empirical Mode Decomposition (EMD). This study examined its possibility based on specific architecture with an on-board Xilinx FPGA. It was helpful for non-stationary biomedical signal processing and cardiovascular diseases research.en_US
dc.language.isoen_USen_US
dc.subjectensemble empirical mode decompositionen_US
dc.subjectphotoplethysmographyen_US
dc.subjectFPGAen_US
dc.titleAn Effective Photoplethysmography Signal Processing System Based on EEMD Methoden_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 International symposium on VLSI Design, Automation and Test (VLSI-DAT)en_US
dc.contributor.department電機學院zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000380584400005en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper