標題: | The Experimental Study of THz Image Sensor in 0.18 mu m CMOS Technology |
作者: | Lai, Chih-Wei Chen, Wei-Cheng Yan, Tzu-Chao Li, Chun-Hsing Kuo, Chien-Nan 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | TIIz image;power detector;CMOS;responsivity |
公開日期: | 2014 |
摘要: | In this study, four different types of power detectors are implemented in 0.18 mu m CMOS technology for the THz image sensor application. These power detectors include common-source with and without supply voltage, and common gate with and without supply voltage. The measured responsivities at 332 GHz are 632 kV/W, 13.2 kV/W, 16.2 kV/W, and 9.1 kV/W, respectively. The image resolution of the proposed THz sensor is 2 mm. |
URI: | http://hdl.handle.net/11536/136122 |
ISBN: | 978-4-9023-3931-4 |
期刊: | 2014 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC) |
起始頁: | 148 |
結束頁: | 150 |
Appears in Collections: | Conferences Paper |