完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLai, Chih-Weien_US
dc.contributor.authorChen, Wei-Chengen_US
dc.contributor.authorYan, Tzu-Chaoen_US
dc.contributor.authorLi, Chun-Hsingen_US
dc.contributor.authorKuo, Chien-Nanen_US
dc.date.accessioned2017-04-21T06:49:49Z-
dc.date.available2017-04-21T06:49:49Z-
dc.date.issued2014en_US
dc.identifier.isbn978-4-9023-3931-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/136122-
dc.description.abstractIn this study, four different types of power detectors are implemented in 0.18 mu m CMOS technology for the THz image sensor application. These power detectors include common-source with and without supply voltage, and common gate with and without supply voltage. The measured responsivities at 332 GHz are 632 kV/W, 13.2 kV/W, 16.2 kV/W, and 9.1 kV/W, respectively. The image resolution of the proposed THz sensor is 2 mm.en_US
dc.language.isoen_USen_US
dc.subjectTIIz imageen_US
dc.subjectpower detectoren_US
dc.subjectCMOSen_US
dc.subjectresponsivityen_US
dc.titleThe Experimental Study of THz Image Sensor in 0.18 mu m CMOS Technologyen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC)en_US
dc.citation.spage148en_US
dc.citation.epage150en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000380417700404en_US
dc.citation.woscount0en_US
顯示於類別:會議論文