Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yeh, Chao-Chun | en_US |
dc.contributor.author | Huang, Shih-Kun | en_US |
dc.date.accessioned | 2017-04-21T06:49:29Z | - |
dc.date.available | 2017-04-21T06:49:29Z | - |
dc.date.issued | 2015 | en_US |
dc.identifier.isbn | 978-1-4673-6563-5 | en_US |
dc.identifier.issn | 0730-3157 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/COMPSAC.2015.125 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/136228 | - |
dc.description.abstract | In android ecosystem, the Apps marketplace vendor faces huge number of Apps with irregular quality. Besides bug finding, coverage index is neglected for the current Android testing services. However it is also a challenge to measure the testing coverage without source code. In this paper, we provide a systematic approach to measure the App testing coverage for black-box testing and implement CovDroid, a black-box coverage system for android. Furthermore, we use a App with different test cases to prove our concept that coverage index can improve the App and measure test cases quality for App market or testing vendors. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Android | en_US |
dc.subject | App Testing | en_US |
dc.subject | Coverage Testing | en_US |
dc.subject | Black Box testing | en_US |
dc.title | CovDroid: A Black-Box Testing Coverage System for Android | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1109/COMPSAC.2015.125 | en_US |
dc.identifier.journal | IEEE 39TH ANNUAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE WORKSHOPS (COMPSAC 2015), VOL 3 | en_US |
dc.citation.spage | 447 | en_US |
dc.citation.epage | 452 | en_US |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | 資訊技術服務中心 | zh_TW |
dc.contributor.department | Department of Computer Science | en_US |
dc.contributor.department | Information Technology Services Center | en_US |
dc.identifier.wosnumber | WOS:000381598900075 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Conferences Paper |