完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chung, Steve S. | en_US |
dc.date.accessioned | 2017-04-21T06:48:17Z | - |
dc.date.available | 2017-04-21T06:48:17Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.isbn | 978-1-4673-8969-3 | en_US |
dc.identifier.issn | 2159-3523 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/136467 | - |
dc.description.abstract | The strategy and solutions in the design of tunneling FET for low voltage/power applications will be addressed in this paper. Two different approaches have been demonstrated. The first design is based on the design of a raised-drain structure which results in a low C-gd, and the reduction of source-to-drain leakage. The second design is based on the concept of alignment between the max. electric field and B2BT rate to enhance the performance of TFET. It was demonstrated in an L-gate structure TFET. Both cases show an efficient improvement of the Ion current, lower S.S. and good delay performance. Finally, a bi-directional pass gate has been applied to complementary TFET SRAM to improve the WNM and RSNM, with operation voltage down to 0.3V. This shows great potential of the proposed TFET structure and schemes for ultra-low power applications. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Tunneling FET | en_US |
dc.subject | Band-to-band tunneling | en_US |
dc.subject | low power | en_US |
dc.subject | SRAM | en_US |
dc.title | High Performance Design of Tunneling FET for Low Voltage/Power Applications: Strategies and Solutions | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 7TH IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE (INEC) 2016 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000386737900178 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |