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dc.contributor.authorChung, Steve S.en_US
dc.date.accessioned2017-04-21T06:48:17Z-
dc.date.available2017-04-21T06:48:17Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-4673-8969-3en_US
dc.identifier.issn2159-3523en_US
dc.identifier.urihttp://hdl.handle.net/11536/136467-
dc.description.abstractThe strategy and solutions in the design of tunneling FET for low voltage/power applications will be addressed in this paper. Two different approaches have been demonstrated. The first design is based on the design of a raised-drain structure which results in a low C-gd, and the reduction of source-to-drain leakage. The second design is based on the concept of alignment between the max. electric field and B2BT rate to enhance the performance of TFET. It was demonstrated in an L-gate structure TFET. Both cases show an efficient improvement of the Ion current, lower S.S. and good delay performance. Finally, a bi-directional pass gate has been applied to complementary TFET SRAM to improve the WNM and RSNM, with operation voltage down to 0.3V. This shows great potential of the proposed TFET structure and schemes for ultra-low power applications.en_US
dc.language.isoen_USen_US
dc.subjectTunneling FETen_US
dc.subjectBand-to-band tunnelingen_US
dc.subjectlow poweren_US
dc.subjectSRAMen_US
dc.titleHigh Performance Design of Tunneling FET for Low Voltage/Power Applications: Strategies and Solutionsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal7TH IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE (INEC) 2016en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000386737900178en_US
dc.citation.woscount0en_US
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