Minimum Test Sets for Fan-Out Free Networks and Two-Level Networks

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DC Field	Value	Language
dc.contributor.author	李新滿	zh_TW
dc.contributor.author	Shin-Maan Lee	en_US
dc.contributor.author	Charles A. Harlow	en_US
dc.date.accessioned	2017-10-06T06:18:05Z	-
dc.date.available	2017-10-06T06:18:05Z	-
dc.date.issued	1974-03	en_US
dc.identifier.uri	http://hdl.handle.net/11536/137501	-
dc.description.abstract	Algorithms are preaented for generating minimum multiple-fault detection test lets for fan-out free networks and nonredundant two-level networks. A test set is minimum in the sense that there is no set with a smaller number of test patterns that detects all the faults in the network.	en_US
dc.language.iso	en_US	en_US
dc.publisher	交大學刊編輯委員會	zh_TW
dc.title	Minimum Test Sets for Fan-Out Free Networks and Two-Level Networks	en_US
dc.type	Campus Publications	en_US
dc.identifier.journal	交大學刊	zh_TW
dc.identifier.journal	SCIENCE BULLETIN NATIONAL CHIAO-TUNG UNIVERSITY	en_US
dc.citation.volume	7	en_US
dc.citation.issue	1	en_US
dc.citation.spage	26	en_US
dc.citation.epage	34	en_US
Appears in Collections:	Science Bulletin National Chiao-Tung University

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